Institute of Electrical and Electronics Engineers
Das to moderate tomorrow’s panel on AI for wireless
Dr. Sajal Das will moderate a panel discussion named “AI for Wireless: Is it Really a Game Changer or Yet Another Hype?” at 9:30-11 a.m. tomorrow (Wednesday, Sept. 2). Tune in via Zoom.
Read More »
Student crafts best paper
Kyle Craft, a senior in aerospace engineering at S&T, received a Best Paper Award from the Institute of Electrical and Electronics Engineers (IEEE).
Read More »Best paper award goes to Marathe
Shubhankar Marathe was awarded the best EMC student paper award at the 2019 IEEE EMC Symposium for the paper “ESD Generator Tip Current Reconstruction using a Current Probe Measurement at the Ground Strap.”
Read More »Sarangapani honored in Hong Kong
Dr. Jagannathan Sarangapani received the Institute of Electrical and Electronics Engineers (IEEE) Control System Society’s Transition to Practice Award during the IEEE Conference on Control Technology and Applications in August in Hong Kong.
Read More »
Wunsch receives international award
Dr. Donald C. Wunsch II received the 2019 International Neural Networks Society (INNS) Ada Lovelace Service Award at the IEEE/INNS International Joint Conference on Neural Networks in Budapest on July 17.
Read More »Madria to talk trust at international conference
Dr. Sanjay Madria will deliver a keynote address this week during the 18th annual IEEE TrustCom in Rotorua, New Zealand.
Read More »Watkins elected to leadership position in IEEE society
- 72Shares
Dr. Steve E. Watkins, professor of electrical and computer engineering, has been elected the 2019-20 vice president of educational activities and awards for the Institute of Electrical and Electronics Engineers (IEEE) Education Society.
Read More »
‘Best paper award’ goes to Brinker
- 7Shares
Katelyn Brinker, a graduate student in electrical and computer engineering, received the Best Student Paper Award at the IEEE International Instrumentation and Measurement Technology Conference in Houston in May. Her paper is titled “Embedded Chipless RFID Measurement Methodology for Microwave Materials Characterization.”
Read More »Two represent university at IEEE society conference
Dr. Anthony Petroy, vice provost for global learning, and Michael Nacy, a junior in electrical engineering, represented Missouri S&T at the IEEE Instrumentation and Measurement Technology Conference in Houston in May.
Read More »