Katelyn Brinker, a graduate student in electrical and computer engineering, received the Best Student Paper Award at the IEEE International Instrumentation and Measurement Technology Conference in Houston in May. Her paper is titled “Embedded Chipless RFID Measurement Methodology for Microwave Materials Characterization.”
Read More »Dr. Anthony Petroy, vice provost for global learning, and Michael Nacy, a junior in electrical engineering, represented Missouri S&T at the IEEE Instrumentation and Measurement Technology Conference in Houston in May.
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