Two represent university at IEEE society conference

Posted by
On June 4, 2018

Dr. Anthony Petroy, vice provost for global learning, and Michael Nacy, a junior in electrical engineering, represented Missouri S&T at the IEEE Instrumentation and Measurement Technology Conference in Houston in May.

The IEEE’s Instrumentation and Measurement Technology Society is dedicated to the development and use of electrical and electronic instruments and equipment to measure, monitor or record physical phenomena.

Share this page

Posted by

On June 4, 2018. Posted in Accomplishments