Katelyn Brinker in the nondestructive testing laboratory on April 27, 2017. Photo by Sam O’Keefe/Missouri S&T
Katelyn Brinker, a graduate student in electrical and computer engineering, received the Best Student Paper Award at the IEEE International Instrumentation and Measurement Technology Conference in Houston in May. Her paper is titled “Embedded Chipless RFID Measurement Methodology for Microwave Materials Characterization.” She wrote the paper with Dr. Reza Zoughi, the Schlumberger Distinguished Professor of Electrical and Computer Engineering.