Current and former members of the Missouri S&T Electromagnetic Compatibility (EMC) Laboratory were honored by the IEEE EMC Society during the yearly symposium held in August in Raleigh, North Carolina.

Daniel Szanto, a Ph.D. student in electrical engineering working in the EMC Laboratory, received the James C. Klouda Memorial Scholarship Award for demonstrating exceptional promise in advancing electromagnetic compatibility through innovative research.

Hanyu Zhang, also a Ph.D. student in electrical engineering working in the lab, along with researchers Zhiping Yang, Alvis Hsu, Ryan Hou and Dr. Chulsoon Hwang, Woodard Associate Professor for Excellence in electrical and computer engineering, earned the Best SI/PI Paper Award for their work titled “Impact of Voltage Regulator Modules on Power Distribution Network Impedance.” The same paper also received honorable mention for the Best Student SI/PI Paper Award.

Lee Hill, who earned a master’s degree in electrical engineering from S&T in 1994, was recognized with the Excellence in Continuing EMC Engineering Education Award for more than 30 years of global instruction in EMC across 13 countries.

Dr. Hanzhi Ma, a former visiting scholar in the lab and now an assistant professor at Zhejiang University in China, received the Herbert K. Mertel Young Professional Award.

Dr. Rodolfo Areneo, a professor at Sapienza University Di Roma and former visiting scholar in the EMC Laboratory, was named IEEE Fellow, an honor awarded to no more than 0.1% of IEEE members annually.